Authors J. Rodríguez-Viejo, K J Jensen, M G Bawendi, J R Heine, M K Kuno, and H Mattousi Citation Key 211 COinS Data Short Title J. Appl. Phys. 87 (2000) 8526-8534 URL http://dx.doi.org/10.1063/1.373573 Year of Publication 2000 ← Effect of Pb in FRHC copper: Phase diagram and solidification studies → Residual stress and texture in polycrystalline 3C-SiC thin films grown by LPCVD