During the last years we have worked in different methods of metrology. We have proposed a point diffraction interferometer in which the phase stepping can be implemented by the use of liquid crystals. He has proposed different numerical methods to obtain the profile of a surface from the data obtained with an optical deflectometer or a wave front sensor. Different types of deflectometer geometries have been studied. These methods are being implemented in commercial set-ups. In collaboration with the ALBA synchrotron that is being built in Barcelona we are developing new methods to measure the shape of X-ray mirrors with ultra-precision.
Deflectometry
We have proposed different numerical methods to obtain the profile of a surface from the data obtained with an optical deflectometer or a wave front sensor. These methods are being implemented in commercial set-ups by Trioptics GmbH Company in Germany.
In collaboration with the ALBA synchrotron that has been built in Barcelona at the Campus of Universitat Autònoma de Barcelona we are developing new methods to measure the shape of X-ray mirrors with ultra precision.
Recent articles:
J. Nicolás, Pedreira, P., Šics, I., Ramírez, C., and Campos, J., “Nanometer accuracy with continuous scans at the ALBA-NOM”, Proc.SPIE, vol. 9962, pp. 9962 – 9962 – 8, 2016.
J. Nicolás and Campos, J., “Error compensation for the calibration of mechanical mirror benders”, Proceedings SPIE, vol. 8848, pp. 88480K-1-8, 2013.
A. Moreno, Espínola, M., Martínez, J. L., and Campos, J., “Methods to obtain the waveform profile from slope measurements”, Proceedings SPIE, vol. 8788, pp. 87881F-1-11, 2013.
Point Diffracction Interferometer
We have proposed a point diffraction interferometer in which the phase stepping can be implemented by the use of liquid crystals. With this set-up we are able to register a holographic movie in which we can, for each time, focus at different planes; visualize what happens at a given plane as a function of time; or follow some object in depth and time. We are developing systems for particle tracking with application in the determination of speed field in a fluid.
Recent articles:
- C. Iemmi, Ramírez, C., and Campos, J., “Digital holographic movie by using a point diffraction interferometer”, Optical Engineering, vol. 54, p. 044104, 2015.
- C. Ramírez, Otón, E., Iemmi, C., Moreno, I., Bennis, N., Otón, J. M., and Campos, J., “Point diffraction interferometer with a liquid crystal monopixel”, Optics Express, vol. 21, pp. 8116-8125, 2013.
- C. Iemmi, Moreno, A., and Campos, J., “Digital holography with a point diffraction interferometer”, Opt. Express, vol. 13, pp. 1885–1891, 2005.
Double sideband interferometer
A new optical architecture, based on a double-sideband filter simultaneously applied at the Fourier plane, is proposed for in-line digital holography. The proposed architecture not only allows to remove additional conjugate images at the final object image but also reduces to certain extent deformations that usually appears when using a single-sideband filter.
Recent articles:
- C. Ramírez, Lizana, A., Iemmi, C., and Campos, J., “Double-sideband filter for digital holography”, Proc. SPIE, vol. 10110, p. 101100C-1, 2017.
- C. Ramírez, Lizana, A., Iemmi, C., and Campos, J., “Method based on the double sideband technique for the dynamic tracking of micrometric particles”, Journal of Optics, vol. 18, p. 065603, 2016.
- C. Ramírez, Lizana, A., Iemmi, C., and Campos, J., “Inline digital holographic movie based on a double-sideband filter”, Opt. Lett., vol. 40, pp. 4142–4145, 2015.
Stitching
Miniresum
Imatge..
Recent articles:
- J. Vidal, Nicolás, J., and Campos, J., “New method to improve the accuracy in a sequential lateral shearing interferometer”, Optical Engineering, vol. 50, pp. 115601-115601-7, 2011.
- J. Vidal, Nicolás, J., and Campos, J., “Analysis of the positioning error on lateral shearing surface reconstruction with a Fizeau interferometer”, Proc. SPIE, vol. 7390, p. 73900N-73900N-8, 2009.
- C. Iemmi, Moreno, A., Nicolás, J., and Campos, J., “Evaluation and correction of aberrations in an optical correlator by phase-shifting interferometry”, Opt. Lett., vol. 28, pp. 1117–1119, 2003.