{"id":695,"date":"2025-11-12T14:29:24","date_gmt":"2025-11-12T12:29:24","guid":{"rendered":"https:\/\/webs.uab.cat\/phynest\/?p=695"},"modified":"2025-11-13T11:25:59","modified_gmt":"2025-11-13T09:25:59","slug":"polarimetric-imaging-for-the-optical-characterization-of-advanced-materials-application-to-organic-glasses-and-nanostructured-materials","status":"publish","type":"post","link":"https:\/\/webs.uab.cat\/phynest\/2025\/11\/12\/polarimetric-imaging-for-the-optical-characterization-of-advanced-materials-application-to-organic-glasses-and-nanostructured-materials\/","title":{"rendered":"Polarimetric Imaging for the Optical Characterization of Advanced Materials: Application to Organic Glasses and nanostructured materials"},"content":{"rendered":"\n
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\"Research<\/figure>\n\n\n\n

Organic semiconductor materials are attracting growing interest due to their advantages over conventional semiconductors such as silicon and germanium. Their lightweight, flexible nature, reduced toxicity, and low production costs make them promising for applications in organic electronics and optoelectronics. Both organic and inorganic nanostructured systems offer unique opportunities, as their electronic and optical properties can be tuned through chemical composition, molecular design, and nanoscale architecture.<\/p>\n\n\n\n

A key challenge is the reliable characterization of these complex materials, as their internal organization and anisotropy directly affect charge transport, exciton dynamics, optical response, and stability. Optical techniques are ideal to addressing this challenge. Advanced polarimetric methods, including generalized ellipsometry and imaging Mueller polarimetry, enable spatially resolved mapping of birefringence, dichroism, depolarization, and molecular orientation, directly linking nanoscale structure to macroscopic function. Despite their potential, these approaches remain underexplored in the study of advanced organic and inorganic nanostructured materials.<\/p>\n\n\n\n

This doctoral thesis will investigate the use of state-of-the-art polarimetric imaging to non-invasively characterize key optical and structural properties of above stated materials. Since imaging techniques will be used, the studies can be applied to analyze heterogeneities within the sample.<\/p>\n\n\n\n

We also aim to investigate whether physical features extracted through polarimetric techniques can be used to train artificial intelligence models capable of identifying key properties of unknown samples. In this way, we seek to establish a data-driven framework that links polarimetric signatures to intrinsic material characteristics. This approach could enable rapid, non-destructive characterization and open new pathways for intelligent material diagnostics and classification.<\/p>\n\n\n\n

\"Academic<\/figure>\n\n\n\n

The candidate should hold a degree in Physics, Materials Science, or a related discipline. A solid foundation in optics and\/or materials engineering is expected, as well as familiarity with experimental laboratory work. While not strictly required, prior knowledge in one or more of the following areas would be considered an asset:<\/p>\n\n\n\n