Authors E. Miranda, X. Aymerich, M. Nafría, R. Rodríguez, and J. Suñé Citation Key 267 COinS Data Date Published 1999 Issue 6 Pagination 265-267 Journal IEEE Electron Device Letters Volume 20 Year of Publication 1999 ← Soft breakdown in ultrathin SiO2 layers: the conduction problem from a new point of view → Detection and fitting of the soft breakdown failure mode in MOS structures