Authors R. Rodríguez, X. Aymerich, J. Suñé, M.Nafría, and E. Miranda Citation Key 274 COinS Data Date Published 1998 Pagination 1127-1131 Journal Microelectronics and Reliability Volume 38 Year of Publication 1998 ← Trapped charge distributions in thin (10nm) SiO2 films subjected to static and dynamic stresses → Analysis of the evolution of the trapped charge distributions in 10nm SiO2 films during DC and bipolar dynamic stress