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- Accession Number
- 11931249
- Authors
- J. Martín-Martínez, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, P. Verheyen, M B González, N. Ayala, and E. Amat
- Citation Key
- 356
- COinS Data
- Date Published
- 2011
- DOI
- 10.1109/SCED.2011.5744167
- ISBN Number
- 978-1-4244-7863-7
- Keywords
- ageing, CMOS integrated circuits, degradation, elemental semiconductors, high-k dielectric thin films, hot carriers, integrated circuit modeling, inverters, MOSFET, semiconductor device models, Silicon, Silicon Germanium, stress
- Pagination
- 1-4
- Conference Location
- Palma de Mallorca
- Conference Name
- 2011 Spanish Conference on Electron Devices
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5744167
- Year of Conference
- 2011