Accession Number
11931249
Authors
J. Martín-Martínez, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, P. Verheyen, M B González, N. Ayala, and E. Amat
Citation Key
356
COinS Data

Date Published
2011
DOI
10.1109/SCED.2011.5744167
ISBN Number
978-1-4244-7863-7
Keywords
ageing, CMOS integrated circuits, degradation, elemental semiconductors, high-k dielectric thin films, hot carriers, integrated circuit modeling, inverters, MOSFET, semiconductor device models, Silicon, Silicon Germanium, stress
Pagination
1-4
Conference Location
Palma de Mallorca
Conference Name
2011 Spanish Conference on Electron Devices
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5744167
Year of Conference
2011