Authors M. Maestro, X. Aymerich, M. Nafría, F. Campabadal, R. Rodríguez, M B González, A. Crespo-Yepes, J. Díaz, and J. Martín-Martínez Citation Key 415 COinS Data Journal Microelectronics Reliability Year of Publication 2015 ← A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics → Intra-device statistical parameters in variability-aware modelling of resistive switching devices