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- Accession Number
- WOS:000321229200037
- Authors
- V. Iglesias, G. Bersuker, L. Frey, A. J. Bauer, K. Murakami, M. Rommel, T. Erlbacher, X. Aymerich, M. Nafría, R. Rodríguez, M. Porti, and J. Martín-Martínez
- Citation Key
- 409
- COinS Data
- Date Published
- SEP 2013
- DOI
- 10.1016/j.mee.2013.03.022
- ISSN
- 0167-9317
- Keywords
- Bimodal Weibull distributions, conductive atomic force microscopy, Dielectric Breakdown, Grain boundaries, high-k
- Pagination
- 129-132
- Journal
- Microelectronics Reliability
- Start Page
- 129
- Type of Article
- Article
- URL
- http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2MgRVtjG5XTWRwBNXJ&page=2&doc=16
- Volume
- 109
- Year of Publication
- 2013