Authors E. Amat, G. Groeseneken, X. Aymerich, M. Nafría, R. Rodríguez, R. Degraeve, and T. Kauerauf Citation Key 165 COinS Data Date Published 2009 Pagination 1908-1910 Journal Microelectronic Engineering Volume 86(7-9) Year of Publication 2009 ← New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices → Channel Hot Carriers degradation and Bias Temperature Instabilities in CMOS inverters