Authors
M. Lanza, M. Fasoli, A. Vedda, G. Ghinidi, A. Sebastiani, X. Aymerich, M. Nafría, and M. Porti
Citation Key
307
COinS Data

Date Published
DEC 2009
DOI
10.1109/TDMR.2009.2027228
ISBN Number
526UW
ISSN
1530-4388
Keywords
Atomic force microscopy (AFM); luminescence; MOS memory integrated circuits
Issue
4
Pagination
529-536
Journal
IEEE Transactions on Device and Materials Reliability
Start Page
529
Type of Article
Article; Proceedings Paper
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5165000
Volume
9
Year of Publication
2009