- Authors
- E. Amat, G. Groeseneken, X. Aymerich, M. Nafría, R. Rodríguez, R. Degraeve, and T. Kauerauf
- Citation Key
- 163
- COinS Data
- Date Published
- 2009
- Pagination
- 454-458
- Journal
- IEEE Transactions on Device and Materials Reliability
- Volume
- 9 (3)
- Year of Publication
- 2009