Accession Number
15937872
Authors
C. Couso, G. Bersuker, A. Cordes, N. Domingo, M. Nafría, S. Claramunt, M. Porti, and V. Iglesias
Citation Key
420
COinS Data

Date Published
March 2016
DOI
10.1109/LED.2016.2537051
ISSN
0741-3106
Keywords
III-V semiconductors; Poole-Frenkel effect; AFM; dislocations; elemental semiconductors; temperature measurement; thermionic emission; Surface topography; Temperature distribution
Issue
5
Pagination
640-643
Publisher
IEEE
Journal
IEEE Electron Device Letters
Start Page
640
Type of Article
Paper
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7422696&queryText=C.%20Couso&sortType=desc_p_Publication_Year
Volume
37
Year of Publication
2016