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- Accession Number
- 15937872
- Authors
- C. Couso, G. Bersuker, A. Cordes, N. Domingo, M. Nafría, S. Claramunt, M. Porti, and V. Iglesias
- Citation Key
- 420
- COinS Data
- Date Published
- March 2016
- DOI
- 10.1109/LED.2016.2537051
- ISSN
- 0741-3106
- Keywords
- III-V semiconductors; Poole-Frenkel effect; AFM; dislocations; elemental semiconductors; temperature measurement; thermionic emission; Surface topography; Temperature distribution
- Issue
- 5
- Pagination
- 640-643
- Publisher
- IEEE
- Journal
- IEEE Electron Device Letters
- Start Page
- 640
- Type of Article
- Paper
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7422696&queryText=C.%20Couso&sortType=desc_p_Publication_Year
- Volume
- 37
- Year of Publication
- 2016