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- Authors
- Q. Wu, E. Simoen, M B González, X. Aymerich, M. Nafría, V. Velayudhan, R. Rodríguez, M. Lanza, J. Martín-Martínez, M. Porti, and A. Bayerl
- Citation Key
- 380
- COinS Data
- Date Published
- 19 August 2014
- DOI
- 10.1109/TED.2014.2341315
- ISSN
- 0018-9383
- Keywords
- Atomic force microscopy (AFM), channel hot-carrier (CHC) degradation, Current measurement, degradation, dielectrics, logic gates, MOSFET, Nanoscale devices, negative bias temperature instability (NBTI), stress
- Issue
- 9
- Pagination
- 3118-3124
- Journal
- Electron Devices, IEEE Transactions on
- Start Page
- 3118
- Type of Article
- Article
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6880443
- Volume
- 61
- Year of Publication
- 2014