Authors
H. Amrouch, X. Aymerich, M. Nafría, R. Rodríguez, M. Moras, V. M. van Santen, and J. Martín-Martínez
Citation Key
394
COinS Data

Date Published
April 2015
DOI
10.1109/IRPS.2015.7112711
ISBN Number
15180453
Keywords
aging, aging phenomena, bias temperature instability, BTI, complex physical-based model, estimaation theory, MOSFET, NBTI, on-chip system, reliability estimation, scaling, semiconductor device reliability, stress, TDDB, temperature dependece, time depende
Conference Location
Monterey, CA
Publisher
IEEE
Conference Name
International Reliability Physics Symposium (IRPS)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112711&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2015