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- Authors
- V. Iglesias, G. Bersuker, T. Schroeder, P. Dudek, X. Aymerich, M. Nafría, and M. Porti
- Citation Key
- 155
- COinS Data
- DOI
- 10.1063/1.3533257
- ISSN
- 0003-6951
- Keywords
- Atomic force microscopy, crystallisation, electrical breakdown, electrical conductivity, Grain boundaries, Hafnium compounds, high-k dielectric thin films
- Issue
- 26
- Pagination
- 262906-262906-3
- Journal
- APPLIED PHYSICS LETTERS
- Start Page
- 262906
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5680522&queryText%3DCorrelation+between+the+nanoscale+electrical+and+morphological+properties+of+crystallized+hafnium+oxide-based+metal+oxide+semiconductor+structures
- Volume
- 97
- Year of Publication
- 2010