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- Accession Number
- 11931299
- Authors
- A. Crespo-Yepes, X. Aymerich, M. Nafría, R. Rodríguez, and J. Martín-Martínez
- Citation Key
- 318
- COinS Data
- Date Published
- FEB 2011
- DOI
- 10.1109/SCED.2011.5744217
- ISBN Number
- 978-1-4244-7863-7
- Keywords
- CMOS devices, Dielectric Breakdown, high-k, reliability, resistive switching
- Conference Location
- Palma de Mallorca
- Conference Name
- Spanish Conference on Electron Devices (CDE), 2011
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5744217
- Year of Publication
- 2011