Accession Number
WOS:000404703800016
Authors
C. Couso, X. Aymerich, M. Nafría, M. Porti, and J. Martín-Martínez
Citation Key
435
COinS Data

Date Published
June 2017
DOI
10.1109/LED.2017.2680545
ISSN
0167-9317 (eISSN: 1873-5568)
Keywords
Bias temperature instability (BTI), Interface traps, MOSFETs, Random telegraph noise (RTN), Technology computer aided design (TCAD), variability
Pagination
66-70
Journal
Microelectronics Engineering
Start Page
66
URL
http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=2&SID=W2AD7bZyrMVqntOuSYl&page=1&doc=1
Volume
178
Year of Publication
2017