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- Accession Number
- WOS:000404703800016
- Authors
- C. Couso, X. Aymerich, M. Nafría, M. Porti, and J. Martín-Martínez
- Citation Key
- 435
- COinS Data
- Date Published
- June 2017
- DOI
- 10.1109/LED.2017.2680545
- ISSN
- 0167-9317 (eISSN: 1873-5568)
- Keywords
- Bias temperature instability (BTI), Interface traps, MOSFETs, Random telegraph noise (RTN), Technology computer aided design (TCAD), variability
- Pagination
- 66-70
- Journal
- Microelectronics Engineering
- Start Page
- 66
- URL
- http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=2&SID=W2AD7bZyrMVqntOuSYl&page=1&doc=1
- Volume
- 178
- Year of Publication
- 2017