Authors R. Fernández, X. Aymerich, M. Nafría, R. Rodríguez, and J. Martín-Martínez Citation Key 173 COinS Data Date Published 2008 Pagination 997-1004 Journal IEEE Transactions on Electron Devices Volume 55 Year of Publication 2008 ← Contributions of the gate current and channel current variation to the post-breakdown MOSFET performance → Improving the electrical performance of Conductive Atomic Force Microscope with a logarithmic current-to-voltage converter