Accession Number
11626346
Authors
G. Bersuker, R. Jammy, P. Kirsch, A. Shluger, K. McKenna, M. Nafría, M. Porti, V. Iglesias, and J. Yum
Citation Key
376
COinS Data

Date Published
September 2010
DOI
10.1109/ESSDERC.2010.5618225
ISBN Number
978-1-4244-6658-0
Keywords
Atomic force microscopy, conductive AFM measurements, constant voltage stress, currents measurements, dielectric devices, dielectric measuresments, dielectrics, electrical measurements, electron traps, Grain boundaries, grain boundaries-driven leakage pat
Pagination
333-336
Conference Location
Sevilla, Spain
Conference Name
2010 Proceedings of the European Solid-State Device Research Conference (ESSDERC)
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5618225
Year of Conference
2010