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- Accession Number
- 11626346
- Authors
- G. Bersuker, R. Jammy, P. Kirsch, A. Shluger, K. McKenna, M. Nafría, M. Porti, V. Iglesias, and J. Yum
- Citation Key
- 376
- COinS Data
- Date Published
- September 2010
- DOI
- 10.1109/ESSDERC.2010.5618225
- ISBN Number
- 978-1-4244-6658-0
- Keywords
- Atomic force microscopy, conductive AFM measurements, constant voltage stress, currents measurements, dielectric devices, dielectric measuresments, dielectrics, electrical measurements, electron traps, Grain boundaries, grain boundaries-driven leakage pat
- Pagination
- 333-336
- Conference Location
- Sevilla, Spain
- Conference Name
- 2010 Proceedings of the European Solid-State Device Research Conference (ESSDERC)
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5618225
- Year of Conference
- 2010