Authors
Q. Wu, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, J. Martín-Martínez, M. Lanza, A. Bayerl, and M. Porti
Citation Key
391
COinS Data

Date Published
Feb 2015
DOI
10.1109/CDE.2015.7087505
ISBN Number
15060336
Keywords
CAFM, channel hot carrier stress, CHC stress, conductive atomic force microscope, gate dielectric, MOSFET, nanoscale electrical properties, NBTI stress, negative bias temperature instability stress, nonstrained MOSFET
Conference Location
Madrid
Publisher
IEEE
Conference Name
Electron Device Spanish Conference (CDE)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087505&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2015