Authors
M. Lanza, G. Jaschke, H. Ranzinger, E. Lodermeier, W. Frammelsberger, G. Benstetter, M. Nafría, and M. Porti
Citation Key
215
COinS Data

Date Published
2007
Pagination
1424-1428
Journal
Microelectronics Reliability
Volume
47
Year of Publication
2007