Authors
O. Pirrotta, G. Bersuker, M. Nafría, M. Porti, A. Padovani, M. Lanza, and L. Larcher
Citation Key
407
COinS Data

Date Published
7 OCT 2014
DOI
WOS:000325488700052
ISBN Number
1089-7550
ISSN
0021-8979
Keywords
AFM, CAFM, Grain, Grain Boundary, HfO2, Leakage current, microscopy, OXIDES, oxygen vacancies, poly-cristalline, Thin dielectrics
Issue
13
Journal
JOURNAL OF APPLIED PHYSICS
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2MgRVtjG5XTWRwBNXJ&page=2&doc=13
Volume
114
Year of Publication
2014