- Authors
- J. Martín-Martínez, G. Ghidini, A. Paccagnella, A. Cester, X. Aymerich, M. Nafría, R. Rodríguez, and S. Gerardin
- Citation Key
- 214
- COinS Data
- Date Published
- 2007
- Pagination
- 1349-1352
- Journal
- Microelectronics Reliability
- Volume
- 47
- Year of Publication
- 2007