Authors
M. Maestro, X. Aymerich, F. Campabadal, M. Nafría, R. Rodríguez, J. Martín-Martínez, M B González, A. Crespo-Yepes, and J. Díaz
Citation Key
390
COinS Data

Date Published
Jan 2015
DOI
10.1109/ULIS.2015.7063791
ISBN Number
14999164
Keywords
characterization method measurement time resolution, high resolution random telegraph noise, Integrated circuit reliability, resistive RAM, Resistive Switching resolution, RRAM, RTN measurement procedure, weighted time lag method
Conference Location
Bologna
Publisher
IEEE
Conference Name
Ultimate Investigation on Silicon joint International EUROSOI (EUROSOI-ULIS)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063791&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2015