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- Authors
- J. Martín-Martínez, X. Aymerich, M. Nafría, R. Rodríguez, and J. Díaz
- Citation Key
- 395
- COinS Data
- Date Published
- 13 March 2014
- DOI
- 10.1109/LED.2014.2304673
- ISBN Number
- 14181345
- ISSN
- 0741-3106
- Keywords
- characterization, CMOS, Monte Carlo generated RTS traces, Monte Carlo methods, MOSFET, random noise, random telegraph noise, random telegraph signals, semicondcutor device noise, transistors, weighted time lag method
- Issue
- 4
- Pagination
- 479-481
- Journal
- IEEE Electron Device Letters
- Start Page
- 479
- Type of Article
- Article
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6766663&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Volume
- 35
- Year of Publication
- 2014