Authors
E. Amat, E. Simoen, P. Verheyen, X. Aymerich, M. Nafría, R. Rodríguez, M B González, and J. Martín-Martínez
Citation Key
365
COinS Data

Date Published
January 2011
DOI
10.1116/1.3523396
ISSN
1071-1023
Keywords
channel hot carriers, CHC, circuit reliability predictions, CMOS technology, elemental semiconductors, Ge-Si alloys, MOSFET, reliability, Silicon
Issue
1
Pagination
01AB07-01AB07-4
Journal
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Start Page
01AB07
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5700618&sortType%3Ddesc_p_Publication_Year%26queryText%3DMartin-Martinez
Volume
29
Year of Publication
2011