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- Accession Number
- 13101521
- Authors
- J. Martín-Martínez, X. Aymerich, M. Nafría, R. Rodríguez, and N. Ayala
- Citation Key
- 360
- COinS Data
- DOI
- 10.1109/SMACD.2012.6339386
- ISBN Number
- 978-1-4673-0685-0
- Keywords
- Bias Temperature Instabilites, BTI, degradation phenomena, Integrated circuit reliability, MOSFET, physical models, RELAB capabilities, RELAB tool, semiconductor device reliability, simulation tools, simulator, SPICE, stress, transistors, variability
- Pagination
- 249-252
- Conference Location
- Sevilla, Spain
- Conference Name
- 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6339386
- Year of Conference
- 2012