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- Accession Number
- WOS:000297182700025
- Authors
- A. Crespo-Yepes, X. Aymerich, M. Nafría, R. Rodríguez, A. Rothschild, and J. Martín-Martínez
- Citation Key
- 378
- COinS Data
- Date Published
- November 2011
- DOI
- 10.1016/j.sse.2011.06.033
- ISSN
- 0038-1101
- Keywords
- dielectric breakdown reversibility, high-k, Leakage current, MOS devices, reliability, resistive switching, Silicon
- Pagination
- 157-162
- Journal
- SOLID-STATE ELECTRONICS
- Start Page
- 157
- Type of Article
- Article; Proceedings Paper
- URL
- http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2tTlR5F1OPdD3gzcxU&page=1&doc=5
- Volume
- 65-66
- Year of Publication
- 2011