Authors
A. Crespo-Yepes, M. Nafría, R. Rodríguez, X. Aragones, D. Mateo, J. Martín-Martínez, and E. Barajas
Citation Key
433
COinS Data

Date Published
25 June 2017
DOI
10.1016/j.mee.2017.05.021
Keywords
aging, CMOS, degradation, MOSFET, RF power amplifier, RF stress
Pagination
289-292
Journal
Microelectronics Engineering
Start Page
289
Type of Article
Journal
URL
http://www.sciencedirect.com/science/article/pii/S0167931717302186?via%3Dihub
Volume
178
Year of Publication
2017