Authors E. Miranda, X. Aymerich, F. Martín, M. Nafría, R. Rodríguez, and J. Suñé Citation Key 266 COinS Data Date Published 1999 Issue 1 Pagination 2223-2226 Journal Japanese Journal of Applied Physics Volume 38 Year of Publication 1999 ← Switching events in the soft breakdown I-t characteristic of ultra-thin SiO2 layers → A function-fit model for the soft-breakdown failure mode