- Authors
- J Martín-Martinez, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, P. Verheyen, M B González, and E. Amat
- Citation Key
- 158
- COinS Data
- Date Published
- 2010
- Pagination
- 1263-1266
- Journal
- Microelectronics Reliability
- Volume
- 50 (9-11)
- Year of Publication
- 2010