Authors
V. Velayudhan, E. Gámiz, C. Medina, X. Aymerich, M. Nafría, M. Porti, R. Rodríguez, and J. Martín-Martínez
Citation Key
397
COinS Data

Date Published
Oct 2014
DOI
10.1109/VARI.2014.6957078
ISBN Number
14772733
Keywords
drain current, interface states, logic gates, MOSFET, semiconductor device modeling, solid modeling, spatial distribution, standards, TCAD, technology CAD electronics, three-dimensional displays, threshold voltage analytical models, variability. spatial d
Conference Location
Palma de Mallorca
Publisher
IEEE
Conference Name
European Workshop on CMOS Variability (VARI)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6957078&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2014