Skip to the content
- Authors
- V. Iglesias, A. Cordes, G. Bersuker, N. Domingo, E. Miranda, M. Nafría, S. Claramunt, Q. Wu, C. Couso, and M. Porti
- Citation Key
- 392
- COinS Data
- Date Published
- April 2015
- DOI
- 10.1109/IRPS.2015.7112788
- ISBN Number
- 15180560
- Keywords
- CAFM, conductive atomic force microscopy, device electrical characteristics, electrical conduction analysis, high mobility substrates, III-V semiconductors, lattice mismatch, PF emission process, Poole-Frenkel emission process, post-electrically stressed
- Conference Location
- Monterey, CA
- Publisher
- IEEE
- Conference Name
- International Reliability Physics Symposium (IRPS)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112788&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Year of Publication
- 2015