- Authors
- M. Lanza, A. Sebastiani, G. Ghidini, X. Aymerich, M. Nafría, and M. Porti
- Citation Key
- 306
- COinS Data
- Date Published
- SEP-NOV 2009
- DOI
- 10.1016/j.microrel.2009.06.016
- ISBN Number
- 504JG
- ISSN
- 0026-2714
- Keywords
- C-AFM; THIN
- Issue
- 9-11
- Pagination
- 1188-1191
- Journal
- Microelectronics Reliability
- Start Page
- 1188
- Type of Article
- Article; Proceedings Paper
- URL
- http://www.sciencedirect.com/science/article/pii/S0026271409002182
- Volume
- 49
- Year of Publication
- 2009