Trapped charge distributions in thin (10nm) SiO2 films subjected to static and dynamic stresses

Authors

R. Rodríguez, X. Aymerich, J. Suñé, and M. Nafría

Citation Key

273

COinS Data

Date Published

1998

Issue

4

Pagination

881-888

Journal

IEEE Transactions on Electron Devices

Volume

45

Year of Publication

1998