Authors M. Porti, A. Paccagnella, A. Cester, X. Aymerich, M. Nafría, and S. Gerardin Citation Key 207 COinS Data Date Published 2007 Issue 6 Pagination 1891-1897 Journal IEEE Transactions on Nuclear Science Volume 54 Year of Publication 2007 ← Systematic characterization of soft- and hard-breakdown spots using techniques with nanometer resolution → MOSFET Output Characteristics After Oxide Breakdown