REDEC‘s research is carried out in two laboratories equipped for the characterization of electron devices and circuits, at macroscopic and nanoscopic levels
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Device Level Laboratory
- 4284A Precision LCR Meter
- 4156C Precision Semiconductor Parameter Analyzer
- 4155 Precision Semiconductor Parameter Analyzer
- K4200 Semiconductor Characterization System amb PGU
- E5250A Low Leakage switch Mainframe
- 81101A Pulse Generator
- 2431L Oscilloscope
- Software Metrics Agilent I/CV
- SUN Blade 1500
- T-CAD Synopsis software
- PCI-GPIB Board
- HC100 Plotter
- 2 Caixes de Faraday
- Manual Station Probe Wentworth
- Semi-Automatic Station Probe Cascade REL-6100
- TP03010B Termochuck
- APC SAI 2200
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Nanoscale Laboratory
- 4145 Semiconductor Parameter Analyzer
- TDS 220 Oscilloscope
- Low noise preamplifier FEMTO
- Faraday Box
- C-AFM (Conductive Atomic Force Microscope) de Nanotec
- C-AFM amb ambient controlat de Scientec
- ECAFM (Enhaced Conductive Atomic Force Microscope)
- AFG5501 Arbitrari Function Generator
- TK-C1380 Video Camara
- 2636 System Sourcemeter
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