Breu presentació:
Sergi Claramunt was graduated in Physics by the University of Barcelona in 2008 and obtained his Ph.D. in Physics in 2014 at the same institution, with a tesis based on the synthesis and treatment of different materials for nanoelectronic applications, especially graphene. The same year, he began to work in the Reliability of Electron Device and Circuit (REDEC) at the University of Barcelona as a Posdoctoral Researcher. His main research interest is the development and characterizations of graphene based devices and study the Resistive-Switching phenomena of different metal-oxide structures by means of Conductive Atomic Force Microscopy (C-AFM).