Breu presentació:
Xavier Aymerich was graduated in Physics in 1975 and obtained the Ph.D. in 1980 from Universitat Autònoma de Barcelona, with a thesis on tunnel electronic devices performed in collaboration with the LAAS in Toulouse. Full Professor from 1991 in the Dept of Physics at UAB, and from 1996 member of the Department of Electronic Engineering. His scientific interest lies in field of the reliability of micro and nanoelectronic devices, including ultra thin gate oxides, high-k dielectrics, NBTI, resistive switching, ad- hoc reliability characterization of devices by combining SPM tools and conventional microelectronic techniques. Also he is interested in the approach to the reliability at circuit level, including effects on devices variability and circuit reliability simulation. He is member of several national and international committees and authored more than 350 research papers in scientific journals and conferences.