{"id":268,"date":"2011-05-24T15:57:39","date_gmt":"2011-05-24T13:57:39","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/nanoscale-electrical-characterization-si-nc-based-memory-mos-devices\/"},"modified":"2011-05-24T15:57:39","modified_gmt":"2011-05-24T13:57:39","slug":"nanoscale-electrical-characterization-si-nc-based-memory-mos-devices","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/en\/biblio\/nanoscale-electrical-characterization-si-nc-based-memory-mos-devices\/","title":{"rendered":"Nanoscale electrical characterization of Si-nc based memory MOS devices"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-268","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/biblio\/268","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/media?parent=268"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}