{"id":299,"date":"2011-05-24T16:47:07","date_gmt":"2011-05-24T14:47:07","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/new-approach-modelling-oxide-breakdown-cmos-circuits\/"},"modified":"2011-05-24T16:47:07","modified_gmt":"2011-05-24T14:47:07","slug":"new-approach-modelling-oxide-breakdown-cmos-circuits","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/en\/biblio\/new-approach-modelling-oxide-breakdown-cmos-circuits\/","title":{"rendered":"A new approach to the modelling of oxide breakdown on CMOS circuits"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-299","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/biblio\/299","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/media?parent=299"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}