{"id":198,"date":"2011-05-13T12:59:44","date_gmt":"2011-05-13T10:59:44","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/equipment\/"},"modified":"2011-05-13T12:59:44","modified_gmt":"2011-05-13T10:59:44","slug":"equipment","status":"publish","type":"page","link":"https:\/\/webs.uab.cat\/redec\/en\/equipment\/","title":{"rendered":"Equipment"},"content":{"rendered":"

REDEC<\/strong>‘s research is carried out in two laboratories equipped for the characterization of electron devices and circuits, at macroscopic and nanoscopic levels<\/p>\n\n\n\n\n
\n

Device Level Laboratory<\/strong><\/p>\n

    \n
  • 4284A Precision LCR Meter<\/li>\n
  • 4156C Precision Semiconductor Parameter Analyzer<\/li>\n
  • 4155 Precision Semiconductor Parameter Analyzer<\/li>\n
  • K4200 Semiconductor Characterization System amb PGU<\/li>\n
  • E5250A Low Leakage switch Mainframe<\/li>\n
  • 81101A Pulse Generator<\/li>\n
  • 2431L Oscilloscope<\/li>\n
  • Software Metrics Agilent I\/CV<\/li>\n
  • SUN Blade 1500<\/li>\n
  • T-CAD Synopsis software<\/li>\n
  • PCI-GPIB Board<\/li>\n
  • HC100 Plotter<\/li>\n
  • 2 Caixes de Faraday<\/li>\n
  • Manual Station Probe Wentworth<\/li>\n
  • Semi-Automatic Station Probe Cascade REL-6100<\/li>\n
  • TP03010B Termochuck<\/li>\n
  • APC SAI 2200<\/li>\n<\/ul>\n<\/td>\n
 <\/td>\n<\/tr>\n
\n

Nanoscale Laboratory<\/strong><\/p>\n

    \n
  • 4145 Semiconductor Parameter Analyzer<\/li>\n
  • TDS 220 Oscilloscope<\/li>\n
  • Low noise preamplifier FEMTO<\/li>\n
  • Faraday Box<\/li>\n
  • C-AFM (Conductive Atomic Force Microscope) de Nanotec<\/li>\n
  • C-AFM amb ambient controlat de Scientec<\/li>\n
  • ECAFM (Enhaced Conductive Atomic Force Microscope)<\/li>\n
  • AFG5501 Arbitrari Function Generator<\/li>\n
  • TK-C1380 Video Camara<\/li>\n
  • 2636 System Sourcemeter<\/li>\n<\/ul>\n<\/td>\n
 <\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

 <\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

REDEC‘s research is carried out in two laboratories equipped for the characterization of electron devices and circuits, at macroscopic and nanoscopic levels Device Level Laboratory 4284A Precision LCR Meter 4156C Precision Semiconductor Parameter Analyzer 4155 Precision Semiconductor Parameter Analyzer K4200 Semiconductor Characterization System amb PGU E5250A Low Leakage switch Mainframe 81101A Pulse Generator 2431L Oscilloscope […]<\/p>\n","protected":false},"author":20,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-198","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/pages\/198","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/users\/20"}],"replies":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/comments?post=198"}],"version-history":[{"count":0,"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/pages\/198\/revisions"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/en\/wp-json\/wp\/v2\/media?parent=198"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}