{"id":319,"date":"2011-05-25T09:41:00","date_gmt":"2011-05-25T07:41:00","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/nanometer-scale-electrical-characterization-stressed-ultrathin-sio2-films-using-conducting-a\/"},"modified":"2011-05-25T09:41:00","modified_gmt":"2011-05-25T07:41:00","slug":"nanometer-scale-electrical-characterization-stressed-ultrathin-sio2-films-using-conducting-a","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/es\/biblio\/nanometer-scale-electrical-characterization-stressed-ultrathin-sio2-films-using-conducting-a\/","title":{"rendered":"Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using Conducting Atomic Force Microscopy"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-319","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/biblio\/319","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/media?parent=319"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}