{"id":322,"date":"2011-05-25T09:50:24","date_gmt":"2011-05-25T07:50:24","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/soft-breakdown-conduction-ultrathin-3-5nm-gate-dielectrics\/"},"modified":"2011-05-25T09:50:24","modified_gmt":"2011-05-25T07:50:24","slug":"soft-breakdown-conduction-ultrathin-3-5nm-gate-dielectrics","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/es\/biblio\/soft-breakdown-conduction-ultrathin-3-5nm-gate-dielectrics\/","title":{"rendered":"Soft Breakdown Conduction in Ultrathin (3-5nm) Gate Dielectrics"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-322","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/biblio\/322","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/media?parent=322"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}