{"id":383,"date":"2014-01-13T11:37:54","date_gmt":"2014-01-13T09:37:54","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/processing-dependence-channel-hot-carrier-degradation-strained-si-p-channel-metal-oxide\/"},"modified":"2014-01-13T11:37:54","modified_gmt":"2014-01-13T09:37:54","slug":"processing-dependence-channel-hot-carrier-degradation-strained-si-p-channel-metal-oxide","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/es\/biblio\/processing-dependence-channel-hot-carrier-degradation-strained-si-p-channel-metal-oxide\/","title":{"rendered":"Processing dependence of channel hot-carrier degradation on strained-Si p-channel metal-oxide semiconductor field-effect transistors"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-383","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/biblio\/383","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/es\/wp-json\/wp\/v2\/media?parent=383"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}