{"id":214,"date":"2011-05-23T16:48:23","date_gmt":"2011-05-23T14:48:23","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/gate-voltage-influence-channel-hot-carrier-degradation-high-k-based-devices\/"},"modified":"2011-05-23T16:48:23","modified_gmt":"2011-05-23T14:48:23","slug":"gate-voltage-influence-channel-hot-carrier-degradation-high-k-based-devices","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/gate-voltage-influence-channel-hot-carrier-degradation-high-k-based-devices\/","title":{"rendered":"Gate voltage influence on the Channel Hot-Carrier degradation of high-k based devices"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-214","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/214","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=214"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}