{"id":224,"date":"2011-05-24T13:02:51","date_gmt":"2011-05-24T11:02:51","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/recovery-mosfet-and-circuit-functionality-after-dielectric-breakdown-ultra-thin-high-k-gate\/"},"modified":"2011-05-24T13:02:51","modified_gmt":"2011-05-24T11:02:51","slug":"recovery-mosfet-and-circuit-functionality-after-dielectric-breakdown-ultra-thin-high-k-gate","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/recovery-mosfet-and-circuit-functionality-after-dielectric-breakdown-ultra-thin-high-k-gate\/","title":{"rendered":"Recovery of the MOSFET and circuit functionality after the Dielectric Breakdown of Ultra-Thin High-k Gate Stacks."},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-224","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/224","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=224"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}