{"id":278,"date":"2011-05-24T16:13:16","date_gmt":"2011-05-24T14:13:16","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/influence-manufacturing-process-electrical-properties-thin-4nm-hafnium-based-high-k-stacks-o\/"},"modified":"2011-05-24T16:13:16","modified_gmt":"2011-05-24T14:13:16","slug":"influence-manufacturing-process-electrical-properties-thin-4nm-hafnium-based-high-k-stacks-o","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/influence-manufacturing-process-electrical-properties-thin-4nm-hafnium-based-high-k-stacks-o\/","title":{"rendered":"Influence of the manufacturing process on the electrical properties of thin (< 4nm) Hafnium based high-k stacks observed with CAFM"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-278","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/278","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=278"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}