{"id":279,"date":"2011-05-24T16:14:37","date_gmt":"2011-05-24T14:14:37","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/performance-and-reliability-ultrathin-oxide-nmosfets-under-variable-body-bias\/"},"modified":"2011-05-24T16:14:37","modified_gmt":"2011-05-24T14:14:37","slug":"performance-and-reliability-ultrathin-oxide-nmosfets-under-variable-body-bias","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/performance-and-reliability-ultrathin-oxide-nmosfets-under-variable-body-bias\/","title":{"rendered":"Performance and reliability of ultrathin oxide nMOSFETs under variable body bias"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-279","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/279","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=279"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}