{"id":282,"date":"2011-05-24T16:19:17","date_gmt":"2011-05-24T14:19:17","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/charge-trapping-and-degradation-hfo2sio2-mos-gate-stacks-observed-enhanced-cafm\/"},"modified":"2011-05-24T16:19:17","modified_gmt":"2011-05-24T14:19:17","slug":"charge-trapping-and-degradation-hfo2sio2-mos-gate-stacks-observed-enhanced-cafm","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/charge-trapping-and-degradation-hfo2sio2-mos-gate-stacks-observed-enhanced-cafm\/","title":{"rendered":"Charge trapping and degradation of HfO2\/SiO2 MOS gate stacks observed with Enhanced CAFM"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-282","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/282","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=282"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}